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Title:: Synchrotron Polychromatic X-ray Laue Microdiffraction Study on the Microstructures of Crystalline Materials

Author(s):: PAN Zhihao; ZHOU Guangni; CHEN Kai; Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University

Keywords:: polychromatic X-ray Laue microdiffraction; Crystal structure; Crystal orientation; Microscopic strain; Defect

CLC:

PACS:: -

DOI:: 10.7502/j.issn.1674-3962.2017.03.03

DocumentCode:

Abstract:: With the advent of efficient brightness-preserving X-ray focusing optics and synchrotron radiation-based techniques, local crystal structure, orientation, microscopic elastic strain/stress, and defect type and density can all be probed with a single scan of micro-focused synchrotron polychromatic X-ray Laue diffraction (?XRD), and these microstructural features can be further related to the mechanical and physical properties of the crystals. The ?XRD technique is particularly suitable for the non-destructive and quantitative mapping of the microstructural characteristics of inhomogeneous multiphase polycrystalline samples, as well as imperfect epitaxial crystals, without involving any critical sample preparation procedures. In this paper, three examples are introduced in details. First of all, the orientation distribution Nd2Ir2O7 polycrystals, which are brittle and virtually impossible for fine surface polishing, is mapped using the ?XRD technique and related to its unique electrical conductance distribution. Secondly, the elastic lattice strain distribution in laser 3D printed Ni-based superalloy is studied and compared to the case in cast bulk materials. Finally, the defect type (mainly dislocations) and density are thoroughly mapped from the matrix to the cladding layers of a laser 3D printed Ni-based superalloy. By studying the nano-hardness of the same region using the technique of nano-indentation, the mechanical properties are successfully linked with the dislocation densities. As ?XRD enters its 20th year of existence and new synchrotron nanodiffraction facilities are being built and commissioned around the world, two dimensional or even three dimensional scans on the testing specimens with tiny scanning steps become possible and giant amount of Laue diffraction data are collected. Therefore new data analysis algorithms and tools are being developed. In this paper we briefly review the new achievements and trends in this field. We take the opportunity to overview the current capabilities as well as the latest technical developments, and hopefully can spur more and more Chinese researchers and scientists to take advantage of the powerful ?XRD materials study technique.

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Synchrotron Polychromatic X-ray Laue Microdiffraction Study on the Microstructures of Crystalline Materials(PDF)

MATERIALS CHINA[ISSN:1674-3962/CN:61-1473/TG]

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