[1]米少波,賈春林.像差校正高分辨透射電子顯微術(shù)及其在表征功能氧化物材料結(jié)構(gòu)及界面中的應(yīng)用[J].中國(guó)材料進(jìn)展,2017,(7-8):056-70.[doi:10.7502/j.issn.1674-3962.2017.07.10]
MI Shaobo,JIA Chunlin.Aberration-Corrected High-Resolution Transmission Electron Microscopy and Its Applications in Functional Oxides[J].MATERIALS CHINA,2017,(7-8):056-70.[doi:10.7502/j.issn.1674-3962.2017.07.10]
點(diǎn)擊復(fù)制
像差校正高分辨透射電子顯微術(shù)及其在表征功能氧化物材料結(jié)構(gòu)及界面中的應(yīng)用(
)
中國(guó)材料進(jìn)展[ISSN:1674-3962/CN:61-1473/TG]
- 卷:
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- 期數(shù):
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2017年第7-8期
- 頁(yè)碼:
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056-70
- 欄目:
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前沿綜述
- 出版日期:
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2017-08-31
文章信息/Info
- Title:
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Aberration-Corrected High-Resolution Transmission Electron Microscopy and Its Applications in Functional Oxides
- 作者:
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米少波; 賈春林
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（1. 西安交通大學(xué)材料科學(xué)與工程學(xué)院 金屬材料強(qiáng)度國(guó)家重點(diǎn)實(shí)驗(yàn)，陜西 西安 710049)
（2. 西安交通大學(xué)微電子學(xué)院, 陜西 西安710049）
（3. 德國(guó)于利希研究中心 ERC電鏡中心，德國(guó) 于利希 52425）
- Author(s):
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MI Shaobo; JIA Chunlin
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(1. State Key Laboratory for Mechanical Behavior of Materials, School of Materials Science and Engineering,
Xi‘a(chǎn)n Jiaotong University, Xi’an 710049, China)
(2. School of Microelectronics, Xian Jiaotong University, Xi‘a(chǎn)n 710049, China)
(3. Ernst Ruska Center for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich, Jülich 52425, Germany)
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- 關(guān)鍵詞:
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界面; 顯微結(jié)構(gòu); 氧化物; 像差校正高分辨透射電子顯微術(shù); 負(fù)球差成像術(shù)
- Keywords:
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interface; microstructure; oxides; aberrationcorrected highresolution transmission electron microscopy; negative CS imaging technique
- DOI:
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10.7502/j.issn.1674-3962.2017.07.10
- 文獻(xiàn)標(biāo)志碼:
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A
- 摘要:
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簡(jiǎn)要介紹基于像差校正高分辨透射電子顯微鏡的負(fù)球差成像技術(shù)及其在研究功能氧化物材料原子構(gòu)型中的應(yīng)用。在亞埃尺度的空間分辨率下，負(fù)球差成像技術(shù)不但可以獲得高襯度的原子尺度結(jié)構(gòu)像，而且可以在皮米精度測(cè)量材料中的原子的相對(duì)位移，從而精確表征材料結(jié)構(gòu)、晶格缺陷的細(xì)微變化及其對(duì)材料性能的影響。負(fù)球差成像技術(shù)為定量解析材料中包含輕原子（例如，氧）在內(nèi)的精細(xì)結(jié)構(gòu)問(wèn)題提供了有力的手段。重點(diǎn)介紹了負(fù)球差成像技術(shù)在表征鐵電材料電偶極矩、疇結(jié)構(gòu)及疇壁，氧化物異質(zhì)界面和三維MgO晶體表面精細(xì)結(jié)構(gòu)中的應(yīng)用。
- Abstract:
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In the present review paper we introduce an imaging technique based on aberrationcorrected TEM, the negative CS imaging (NCSI) technique, which results in a highcontrast of image in comparison with conventional positive CS imaging (PCSI) technique. The novel NSCI technique has been applied for not only acquiring highcontrast atomicresolution structure images of materials, but also determining the relative shifts of atomic columns with a precision of a few picometres. In addition, the NCSI technique provides experimental basis for quantitative analysis of the fine changes of atoms including light elements (eg oxygen) in oxide materials, eg the electric dipoles, domains and domain walls in oxide ferroelectrics, interfaces in heterostructural multilayer films as well as the 3D shape of a nanoscale MgO crystal.
更新日期/Last Update:
2017-09-07